TLA7000 Series Logic Analyzer
Breakthrough Solutions for Real-Time Digital Systems Analysis.
The modular TLA7000 Series Logic Analyzer provides the speed and flexibility you need to capture logic detail on today's fastest microprocessors and memory designs. Pinpoint the source of elusive errors and gain the visibility you want with large easy-to-read displays, fast data throughput, and time-correlated views of analog and digital signals through the same probe.
- Overview
- Application Notes
- Probes & Accessories
- TLA7000 Modules
- Videos
Features |
Benefits |
| MagniVu™ acquisition | Avoid missing events completely in either timing or state acquisition mode with higher sampling resolution (up to 20 ps) on all channels. |
| iCapture™ multiplexing | Eliminate double probing with simultaneous digital and analog acquisition through a single logic analyzer probe. |
| Flagging the glitch | Remove the need to manually search all channels using exclusive ability to show both the time and channel where the glitch occurred. |
| TS/TH violation triggering | Eliminate the time consuming and complex task of monitoring the circuit's outputs with real-time violation triggering that automatically acquires intermittent setup and hold violations. |
| iView™ display | Gain complete system visibility with time-correlated, integrated analog and digital data on one display. |
| iVerify™ analysis | Quickly find signal integrity issues with multi-channel bus analysis using oscilloscope-generated eye diagram. |
| Automated measurements | Easily summarize your design's performance with sophisticated measurements such as: frequency, period, pulse width, duty cycle, and edge count. |
| Drag & drop triggers | Quickly isolate events through simple and intuitive trigger setup. Triggers include: Channel Edge, Channel Value, Bus Value, Multi-Group Value, Glitch, Setup and Hold Violation, or Trigger on Anything. |
- Electrical Verification of DDR2, DDR3,GDDR3 SDRAM and FB-DIMM
Checking circuit board construction, power systems, and signaling is increasingly important as DDR2 SDRAM clock frequencies and signal edge rates increase. This application note covers circuit board, power system, command and data verification. - Simplifying Xilinx and Altera Debug
This application note focuses on the issues and techniques that can help you become more efficient when debugging your FPGA systems. - The Basics of Serial Data Compliance and Validation Measurements
This primer is designed to help you understand the common aspects of serial data transmission and to explain the analog and digital measurement requirements that apply to these emerging serial technologies - Signal Integrity Solutions Fact Sheet
This fact sheet discusses Tektronix' powerful and complete portfolio to overcome signal degradation challenges - Fundamentals of Signal Integrity Primer
This primer is to provide some insight into signal integrity-related problems in digital systems, and to describe their causes, characteristics, effects, and solutions.
Logic Analyzer Probes and Accessories
Today's high speed, low voltage levels signals are very sensitive to signal integrity. Verification and debug of these signals depends on accurate acquisition and probing. Tektronix offers the best performing logic analyzer probes in the industry, ensuring that your acquisition is true reflection of your design's performance.
Third party probes and accessories that complement Tektronix Logic Analyzers
Crescent Heart offers hardware and software products for probing buses, processors and ASIC cores. Further information is available at www.c-h-s.com. 
FuturePlus Systems offers bus analysis probes for memory DDR buses, Serial RapidIO, PCI Express ,and DisplayPort. Further information is available at www.futureplus.com.
Nexus Technology offers hardware adapters, embedded products, probe testers and probe modification kits to connect to industry standard buses for Serial Rapid I/O, DDR3, DDR2, DDR, PCI, PCI-X and others. Further information is available at www.nexustechnology.com.
Moving Pixel offers pattern generator solutions, hardware adapters, and bus supports for MIPI, Fiber Channel, and Hypertransport. Further information is available at http://www.movingpixel.com.
| TLA7AC2 | TLA7000 Logic Analyzer Module, 68 Channels, 8 GHz MagniVu Timing, 235 MHz State Clock, 2 Mb Record Length | Select Your Country |
| TLA7AC3 | TLA7000 Logic Analyzer Module, 102 Channels, 8 GHz MagniVu Timing, 235 MHz State Clock, 2 Mb Record Length | Select Your Country |
| TLA7AC4 | TLA7000 Logic Analyzer Module, 136 Channels, 8 GHz MagniVu Timing, 235 MHz State Clock, 2 Mb Record Length | Select Your Country |
| TLA7BB2 | TLA7000 Logic Analyzer Module, 68 Channels, 50 GHz MagniVu Timing, 750 MHz State Clock, 2 Mb Record Length, 4 BNC Analog Probe Outputs with 3 GHz Bandwidth | Select Your Country |
| TLA7BB3 | TLA7000 Logic Analyzer Module, 102 Channels, 50 GHz MagniVu Timing, 750 MHz State Clock, 2 Mb Record Length, 4 BNC Analog Probe Outputs with 3 GHz Bandwidth | Select Your Country |
| TLA7BB4 | TLA7000 Logic Analyzer Module, 136 Channels, 50 GHz MagniVu Timing, 750 MHz State Clock, 2 Mb Record Length, 4 BNC Analog Probe Outputs with 3 GHz Bandwidth | Select Your Country |
| TLA7BC4 | TLA7000 Logic Analyzer Module, 136 Channels, 50 GHz MagniVu Timing, 750 MHz State Clock, 128 Mb Record Length, 4 BNC Analog Probe Outputs with 3 GHz Bandwidth | Select Your Country |
| TLA7SA08 | TLA7000 Logic Protocol Analyzer Module, 8 Differential Pairs (4 Lanes, x4 Link Width), up to 8 GT/s, 8 GB x8 (160 MSymbols per Lane) record length | Select Your Country |
| TLA7SA16 | TLA7000 Logic Protocol Analyzer Module, 16 Differential Pairs (8 Lanes, x8 Link Width), up to 8 GT/s, 8 GB x8 / 16 GB x16 (160 MSymbols per Lane) record length | Select Your Country |
| PG3 |
Moving Pixel offers pattern generator solutions, hardware adapters, and bus supports for MIPI, Fiber Channel and Hypertransport. | Select Your Country |
View All Videos
Tektronix offers a variety of online videos and webinars to help you solve product and application challenges. Content categories include Embedded Systems, RF/Microwave, Computing and Video Test.